SHARMA, DR.RAVINDER, et al. “EVALUATION OF TECHNO STRESS IN IOT DEVELOPERS USING PSYCHOMETRIC INSTRUMENTS”. TPM – Testing, Psychometrics, Methodology in Applied Psychology, vol. 32, no. S4(2025): Posted 17 July, Aug. 2025, pp. 1130-4, https://tpmap.org/submission/index.php/tpm/article/view/669.