SHARMA, D., CHAKRABARTI, M. S. and NEOGI, D. U. K. (2025) “EVALUATION OF TECHNO STRESS IN IOT DEVELOPERS USING PSYCHOMETRIC INSTRUMENTS”, TPM – Testing, Psychometrics, Methodology in Applied Psychology, 32(S4(2025): Posted 17 July), pp. 1130–1134. Available at: https://tpmap.org/submission/index.php/tpm/article/view/669 (Accessed: 11 September 2025).