SHARMA, DR.RAVINDER; CHAKRABARTI, MR. SOUMYADEEP; NEOGI, DR. U K. EVALUATION OF TECHNO STRESS IN IOT DEVELOPERS USING PSYCHOMETRIC INSTRUMENTS. TPM – Testing, Psychometrics, Methodology in Applied Psychology, [S. l.], v. 32, n. S4(2025): Posted 17 July, p. 1130–1134, 2025. Disponível em: https://tpmap.org/submission/index.php/tpm/article/view/669. Acesso em: 11 sep. 2025.